- bit error rate tester
- block error rate tester
- user configurable connectors for external interfacing
key facts
- bit error rate tester
- block error rate tester
- user configurable connectors for external interfacing
key facts
brief description
extended dut characterization can require bit error rate (ber) or block error rate (bler) testing using a digitally modulated rf signal. many general products in various market segments require an external ber test solution integrated in a signal generator. the option r&s®smw-k80 offers a highly flexible integrated ber and bler test solution.
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