the r&s®fsl-k30 application firmware provides the r&s®fsl spectrum analyzer with features otherwise only provided by special noise measurement analyzers.
the following parameters can be measured at a specified frequency or in a selectable frequency range:
- noise figure in db
- noise temperature in k
- gain in db
compared with conventional noise measurement systems, r&s®fsl-k30 has the advantage that a wide variety of further rf measurements can also be performed.
the r&s®fsl-k30 is also available for the r&s®zvl3 and r&s®zvl6 vector network analyzers (with the r&s®zvl-k1 spectrum analysis option and the r&s®fsl-b5 additional interfaces option).