application firmware r&s®fs-k30 provides the high-grade analyzers with features otherwise only provided by special noise measurement systems. at a specified frequency or in a selectable frequency range the following parameters can be measured:
- noise figure in db
- noise temperature in k
- gain in db
compared to conventional noise measurement systems, r&s®fs-k30 used with the analyzers r&s®fsp/fsu or r&s®fsq has the advantage that a large variety of further rf measurements can also be performed.