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本网络研讨会面向从事高速数字设计和测试工作的工程师。我们将重点讨论 pcie gen 3 接口。研讨会将介绍 pcie 技术，并讨论有关一致性、协议触发和解码以及信号完整性调试的 pcie 测试。
首先，我们将介绍系统互操作性验证。您将详细了解解码、串行触发、眼图测试、去嵌、阻抗控制和抖动分析，这有助于确定一致性测试失败的根本原因。研讨会将通过实例和演示来说明简单可靠的 pcie 测试。
jithu abraham works for rohde & schwarz as a product manager for the uk, ireland and the benelux region, specializing in oscilloscopes. he enjoys all aspects of high-speed digital, wireless communication, efficient power conversion and all the challenges they bring. jithu holds an engineering degree in electronics and communication from the anna university in india and a master’s degree in rf systems from the university of southampton. he has been working for rohde & schwarz for over 12 years.
